Integrated circuit technology and fabrication: lecture 28
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Date
1996
Journal Title
Journal ISSN
Volume Title
Publisher
North Carolina University
Abstract
This lecture is about yield loss mechanisms - the instructor discusses topics such as a) processing problems, b) circuit design, and c) random defects.
Description
Keywords
Processing problems, Circuit design, Random defects., Yield loss mechanisms
Citation
Osburn, C. & Ruggles, G.A. (1996). Integrated circuit technology and fabrication lecture 28, North Carolina University, United States.