Electrical Engineering

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Browsing Electrical Engineering by Subject "C-V characterization technique"

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    Integrated circuit technology and fabrication: lecture 22
    (North Carolina University, 1996) Osburn, Carl, Dr.; Ruggles, Gary A, Dr.
    This video talks about MOS characterization and annealing - in detail it discusses electrical defects found in MOS devices, the development of C-V characterization technique, the effects of processing on electrical defects, and optimal annealing considerations.