Osburn, Carl, Dr.Ruggles, Gary A, Dr.2018-10-152018-10-1519961996Osburn, C. & Ruggles, G.A. (1996). Integrated circuit technology and fabrication lecture 28, North Carolina University, United States.http://196.43.179.3:8080/xmlui/handle/123456789/155This lecture is about yield loss mechanisms - the instructor discusses topics such as a) processing problems, b) circuit design, and c) random defects.en-USProcessing problemsCircuit designRandom defects.Yield loss mechanismsVideo