Osburn, Carl, Dr.Ruggles, Gary A, Dr.2018-10-152018-10-1519961996Osburn, C. & Ruggles, G.A. (1996). Integrated circuit technology and fabrication lecture 21, North Carolina University, United States.http://196.43.179.3:8080/xmlui/handle/123456789/154This video talks about MOS characterization and annealing - in detail it discusses electrical defects found in MOS devices, the development of C-V characterization technique, the effects of processing on electrical defects, and optimal annealing considerations.en-USMOS devicesC-V characterization techniqueElectrical defectsOptimal annealing considerationsVideo