Osburn, Carl Dr.Ruggles, Gary Dr.2018-11-162018-11-1619961996http://196.43.179.3:8080/xmlui/handle/123456789/1306The video talks about yield and reliability and the objectives covered are; 1.Describe considerations in projecting chip yield and reliability 2.Illustrate various defect density distributions and their impact on yield prediction 3.outline odels used to describe failure rates 4.Provide examples of physical degradation mechanisms in chipsen-USVideo